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Metrology

Versatile Large-Envelope X-ray and CT Systems

Nikon’s versatile, large-envelope X-ray and CT systems can inspect items of diverse size and density, internally and externally, enabling them to perform virtually limitless tasks within industry, inspection bureaux and academia.

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metrology

IC6 - Making Excellence Repeatable

The IC6 Thin Film Deposition Controller provides exceptional value by combining the proven performance of INFICON thin film controllers with unique feaures, all designed for you to achieve the most from your deposition process. 

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metrology

Compact SIMS – a design breakthrough for surface analysis

The Hiden Compact SIMS tool is designed for fast and easy characterisation of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic table.

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